An approach to diagnosing of the arising fault in digital systems with symmetric bipartite graph structures

For digital systems (DS) structured as symmetric bipartite graphs, the approach to diagnosing of the arising fault is presented. In order to detect such faults and to work out the correct diagnosis the two- and more fold starting of the diagnosing process with comparison of the results of the two adjacent startings are used. DS have a diagnostic monitor that initiates the diagnosing processes and processes the control results. The example of diagnosing of fault components in the DS including seven processors and seven memories is considered.