O. E. Kaledin, N. K. Sorokina, L. A. Sukharev, “Scheme using neural networks for process control exposure to radiation on the structure of semiconductor materials”, Zhurnal Srednevolzhskogo Matematicheskogo Obshchestva, 2013, Volume 15, Number 4, Pages 190

Zhurnal Srednevolzhskogo Matematicheskogo Obshchestva

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Zhurnal Srednevolzhskogo Matematicheskogo Obshchestva, 2013, Volume 15, Number 4, Pages 190–192 (Mi svmo439)

Short Communications

Scheme using neural networks for process control exposure to radiation on the structure of semiconductor materials

O. E. Kaledin, N. K. Sorokina, L. A. Sukharev

Ogarev Mordovia State University

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Abstract: In this paper, an algorithm for applying neural networks to analyze the structure of silicon by laser irradiation

Keywords: single crystal silicon, neural networks, statistical data.

Document Type: Article

UDC: 517.9

Language: Russian

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https://www.mathnet.ru/eng/svmo439

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