|
|
|
Publications in Math-Net.Ru |
Citations |
|
2024 |
| 1. |
A. V. Novak, V. R. Novak, A. V. Rumyantsev, “Wear of the probe tip depending on the interaction regimes with the sample surface at operating in the amplitude-modulation atomic force microscopy mode”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 50:15 (2024), 25–29   |
|
2019 |
| 2. |
K. A. Korolkova, V. R. Novak, A. V. Sel'kin, “Interface localization of the Wannier–Mott exciton in the organic-semiconductor structure “Langmuir film/CdS””, Fizika Tverdogo Tela, 61:7 (2019), 1362–1367 ; Phys. Solid State, 61:7 (2019), 1304–1309 |
1
|
|
2014 |
| 3. |
A. V. Novak, V. R. Novak, “Evolution of morphology of surface during film growth of polycrystalline silicon with hemispherical grains”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 40:13 (2014), 18–26 ; Tech. Phys. Lett., 40:7 (2014), 549–552 |
3
|
|
2013 |
| 4. |
A. V. Novak, V. R. Novak, “Roughness of amorphous, polycrystalline and hemispherical-grained silicon films”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 39:19 (2013), 32–40 ; Tech. Phys. Lett., 39:10 (2013), 858–861 |
14
|
|
1985 |
| 5. |
O. A. Aktsipetrov, N. N. Akhmediev, I. M. Baranova, E. D. Mishina, V. R. Novak, “Multi-layer Langmuir films for optoelectronics and the nonlinear-optical method of their investigation”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 11:10 (1985), 599–601 |
| 6. |
V. R. Novak, I. V. Myagkov, “Piezoelectric effect in multi-layered Langmuir films”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 11:7 (1985), 385–388 |
|
| Organisations |
|
|
