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Publications in Math-Net.Ru |
Citations |
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2024 |
| 1. |
Yu. M. Nikolaenko, N. B. Efros, N. I. Mezin, I. Yu. Reshidova, “Fundamental and applied aspects of physical characteristics of polycrystalline samples of oxide semiconductor (In$_2$O$_3$)$_{1-x}$ : (SrO)$_x$”, Fizika i Tekhnika Poluprovodnikov, 58:8 (2024), 448–452  |
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2023 |
| 2. |
Yu. M. Nikolaenko, V. G. But'ko, A. A. Gusev, N. B. Efros, “Physical nature of the “stabilization” effect of the oxygen content in La$_{0.8}$Sr$_{0.2}$MnO$_{3+\delta}$ thin films”, Fizika Tverdogo Tela, 65:9 (2023), 1550–1553  |
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2022 |
| 3. |
Yu. M. Nikolaenko, N. B. Efros, D. O. Fedyuk, I. Yu. Reshidova, “Effect of oxygen content "stabilization" in La$_{0.8}$Sr$_{0.2}$MnO$_{3-\delta}$ films at post annealing in air”, Fizika Tverdogo Tela, 64:7 (2022), 794–797 |
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2021 |
| 4. |
Yu. M. Nikolaenko, N. B. Efros, A. N. Artemov, “Oxygen diffusion in different thicknesses La$_{0.8}$Sr$_{0.2}$MnO$_{3-\delta}$ films on NdGaO$_{3}$ substrates”, Zhurnal Tekhnicheskoi Fiziki, 91:12 (2021), 1957–1963 |
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2019 |
| 5. |
Yu. M. Nikolaenko, A. S. Korneevets, N. B. Efros, V. V. Burkhovetskiy, I. Yu. Reshidova, “Assessing the thickness of thin films based on elemental data composition of film structures”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:13 (2019), 44–47 ; Tech. Phys. Lett., 45:7 (2019), 679–682 |
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