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Publications in Math-Net.Ru |
Citations |
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2020 |
| 1. |
A. E. Abdikarimov, “The influence of a single charged interface trap on the subthreshold drain current in FinFETs with different fin shapes”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:10 (2020), 34–37   ; Tech. Phys. Lett., 46:5 (2020), 494–496 |
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2018 |
| 2. |
A. E. Abdikarimov, A. Yusupov, A. E. Atamuratov, “The effect of the fin shape and thickness of the buried oxide on the DIBL effect in an SOI FinFET”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 44:21 (2018), 22–29 ; Tech. Phys. Lett., 44:11 (2018), 962–964 |
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