S. D. Fedotov, V. N. Statsenko, N. N. Egorov, S. A. Golubkov, “Effect of solid-state epitaxial recrystallization on defect density in ultrathin silicon-on-sapphire layers”, Fizika Tverdogo Tela, 61:12 (2019), 2349–2354; Phys. Solid State, 61:12 (2019), 2353–2358
