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Publications in Math-Net.Ru |
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2016 |
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V. F. Zinchenko, K. V. Lavrent’ev, V. V. Emel'yanov, A. S. Vatuev, “Comparative analysis of breakdown mechanism in thin SiO$_2$ oxide films in metal–oxide–semiconductor structures under the action of heavy charged particles and a pulsed voltage”, Zhurnal Tekhnicheskoi Fiziki, 86:2 (2016), 30–36   ; Tech. Phys., 61:2 (2016), 187–193 |
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