N. I. Stas’kov, A. A. Sergeychik, A. B. Sotski, A. N. Pyatlitski, V. A. Pilipenko, L. I. Sotskaya, D. V. Ponkratov, E. A. Chudakov, A. V. Shilov, “Optical characteristics of boron-doped silicon wafers after rapid thermal annealing”, Optics and Spectroscopy, 133:8 (2025), 874–880
