| 1. |
Sanjeev K. Gupta, A. Azam, J. Akhtar, “Effect of post oxidation annealing on electrical characteristics of Ni/SiO$_2$/4H-SiC capacitor with varying oxide thickness”, Fizika i Tekhnika Poluprovodnikov, 46:4 (2012), 562–568 ; Semiconductors, 46:4 (2012), 545–551 |
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