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Publications in Math-Net.Ru |
Citations |
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2024 |
| 1. |
A. G. Karpov, N. V. Egorov, “Algorithms for compiling a mathematical model of physical systems using graphs”, Vestnik S.-Petersburg Univ. Ser. 10. Prikl. Mat. Inform. Prots. Upr., 20:1 (2024), 10–19  |
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2023 |
| 2. |
N. V. Egorov, A. G. Karpov, S. P. Sobolev, “Mathematical methods for analyzing the results of investigation of dielectric”, Vestnik S.-Petersburg Univ. Ser. 10. Prikl. Mat. Inform. Prots. Upr., 19:2 (2023), 212–217 |
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2022 |
| 3. |
A. G. Fedorov, V. V. Trofimov, A. G. Karpov, “Numerical methods and algorithms for reconstruction of holographic images with an flexibility choice of physical size of the object and observation area”, Vestnik S.-Petersburg Univ. Ser. 10. Prikl. Mat. Inform. Prots. Upr., 18:1 (2022), 99–110 |
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2021 |
| 4. |
A. G. Karpov, V. V. Trofimov, A. G. Fedorov, “Information and program support of the analysis and processing of holographic information”, Vestnik S.-Petersburg Univ. Ser. 10. Prikl. Mat. Inform. Prots. Upr., 17:4 (2021), 409–418 |
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2020 |
| 5. |
A. G. Karpov, V. A. Klemeshev, D. Yu. Kuranov, “Determining the ability to work of the system, the structure of which is given using graph”, Vestnik S.-Petersburg Univ. Ser. 10. Prikl. Mat. Inform. Prots. Upr., 16:1 (2020), 41–49 |
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2018 |
| 6. |
A. G. Karpov, V. A. Klemeshev, “Diagnostics of dielectric materials with several relaxation times”, Zhurnal Tekhnicheskoi Fiziki, 88:4 (2018), 634–637  ; Tech. Phys., 63:4 (2018), 618–621 |
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2017 |
| 7. |
A. G. Karpov, V. A. Klemeshev, “Method for determining optical constants and the thickness of the thin film”, Vestnik S.-Petersburg Univ. Ser. 10. Prikl. Mat. Inform. Prots. Upr., 13:1 (2017), 17–26 |
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2015 |
| 8. |
A. G. Karpov, V. A. Klemeshev, V. V. Trofimov, “Mathematical foundations of information processing methods for dielectric spectroscopy of thin films”, Vestnik S.-Petersburg Univ. Ser. 10. Prikl. Mat. Inform. Prots. Upr., 2015, no. 4, 13–26 |
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2011 |
| 9. |
A. G. Karpov, A. G. Fedorov, “Numerical restoration of holographic images for research of structure of thin films”, Vestnik S.-Petersburg Univ. Ser. 10. Prikl. Mat. Inform. Prots. Upr., 2011, no. 2, 76–80 |
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