| 1. |
V. F. Dryakhlushin, V. P. Veiko, N. B. Voznesenskii, “Scanning near-field optical microscopy and near-field optical probes: properties, fabrication, and control of parameters”, Kvantovaya Elektronika, 37:2 (2007), 193–203 [Quantum Electron., 37:2 (2007), 193–203 ] |
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