aScientific and Practical Materials Research Center, National Academy of Sciences of Belarus, Minsk, Belarus bDepartment of Practical Training of Students, Belorussian State Technical Agrarian University, Minsk, Belarus
Аннотация:
Low-temperature XRD measurements were performed to confirm the phase composition and structural parameters of the electrochemically deposited Cu2ZnSnSe4 thin films on flexible metal substrates.
Образец цитирования:
A. V. Stanchik, V. A. Chumak, V. F. Gremenok, S. M. Baraishuk, “A low-temperature X-ray diffraction study of the Cu2ZnSnSe4 thin films”, Mendeleev Commun., 31:5 (2021), 726–727