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Publications in Math-Net.Ru |
Citations |
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2019 |
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Yu. V. Balakshin, A. V. Kozhemiako, S. Petrovic, M. Erich, A. A. Shemukhin, V. S. Chernysh, “Influence of the charge state of xenon ions on the depth distribution profile upon implantation into silicon”, Fizika i Tekhnika Poluprovodnikov, 53:8 (2019), 1030–1036   ; Semiconductors, 53:8 (2019), 1011–1017 |
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2013 |
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S. Bellucci, Yu. A. Chesnokov, P. N. Chirkov, M. Ćosic, G. Giannini, V. A. Maisheev, S. Petrović, I. A. Yazynin, “Deflection of 100 MeV positron beam by repeated reflections in thin crystals”, Pis'ma v Zh. Èksper. Teoret. Fiz., 98:11 (2013), 739–742 ; JETP Letters, 98:11 (2013), 649–651   |
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