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Surface, interfaces, thin films
Structural and photoelectric properties the thin film ZnO on ZnО-LiTaO$_{3}$ substrate
L. V. Grigor'evab, A. A. Semenova, A. V. Mikhailovc a Saint Petersburg State University
b Saint Petersburg Electrotechnical University "LETI"
c All-Russian Research Center "S. I. Vavilov State Optical Institute", St. Petersburg
Abstract:
The results of the study of the structural and photoelectric properties of the ZnО-LiTaO$_{3}$ thin-film structure are presented. The results
$X$-ray structural analysis and results atomic force microscopy of the surface zinc oxide thin films synthesized on a single-crystal lithium tantalite substrate and on a KU-1 quartz substrate are presented. The spectral dependence of photoconductivity in the thin film structure of ZnО-LiTaO$_{3}$ and the structure of ZnO–quartz in the ultraviolet and visible spectral ranges are presented.
Keywords:
zinc oxide, laser ablation, ferroelectric materials, X-ray structural analysis, atomic-force microscopy surface, photoconductivity, method Tikhonov–Lavrentiev regularization.
Received: 27.07.2021 Revised: 02.08.2021 Accepted: 02.08.2021
Citation:
L. V. Grigor'ev, A. A. Semenov, A. V. Mikhailov, “Structural and photoelectric properties the thin film ZnO on ZnО-LiTaO$_{3}$ substrate”, Fizika i Tekhnika Poluprovodnikov, 55:12 (2021), 1180–1185
Linking options:
https://www.mathnet.ru/eng/phts4914 https://www.mathnet.ru/eng/phts/v55/i12/p1180
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