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Fizika i Tekhnika Poluprovodnikov, 2020, Volume 54, Issue 7, Pages 654–662
DOI: https://doi.org/10.21883/FTP.2020.07.49506.9336 (Mi phts5208) 		 
Semiconductor structures, low-dimensional systems, quantum phenomena

Scattering matrix method for calculating the spontaneous-emission probability in cylindrically symmetric structures

V. V. Nikolaeva, K. A. Ivanovbc, K. M. Morozovbc, A. V. Belonovskiid

a Ioffe Institute, St. Petersburg
b St. Petersburg National Research University of Information Technologies, Mechanics and Optics
c Alferov Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg
d St. Petersburg National Research Academic University, Russian Academy of Sciences;ITMO University
Full-text PDF (208 kB)
DOI: https://doi.org/10.21883/FTP.2020.07.49506.9336
Abstract: A method is developed for analyzing spontaneous-emission modification in cylindrically symmetric structures. A matrix method is developed for cylindrical structures. General expressions for the radiative-recombination rate are derived for an emitter placed at any point on the structure. Quantitative indicators for estimating radiative-recombination enhancement and suppression are determined; they can be considered as modal Purcell factors. An expression for the total Purcell factor is derived for an emission direction perpendicular to the symmetry axes of the medium; as well as an expression for the integral (total) Purcell factor for the emitter at the symmetry axis.
Keywords: nanophotonics, spontaneous radiative recombination, Purcell effect.
Funding agency Grant number
Russian Science Foundation 16-12-10503
Received: 16.12.2019
Revised: 20.02.2019
Accepted: 20.02.2019
English version:
Semiconductors, 2020, Volume 54, Issue 7, Pages 765–773
DOI: https://doi.org/10.1134/S1063782620070106
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. V. Nikolaev, K. A. Ivanov, K. M. Morozov, A. V. Belonovskii, “Scattering matrix method for calculating the spontaneous-emission probability in cylindrically symmetric structures”, Fizika i Tekhnika Poluprovodnikov, 54:7 (2020), 654–662; Semiconductors, 54:7 (2020), 765–773
Citation in format AMSBIB
\Bibitem{NikIvaMor20}
\by V.~V.~Nikolaev, K.~A.~Ivanov, K.~M.~Morozov, A.~V.~Belonovskii
\paper Scattering matrix method for calculating the spontaneous-emission probability in cylindrically symmetric structures
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2020
\vol 54
\issue 7
\pages 654--662
\mathnet{http://mi.mathnet.ru/phts5208}
\crossref{https://doi.org/10.21883/FTP.2020.07.49506.9336}
\elib{https://elibrary.ru/item.asp?id=43808039}
\transl
\jour Semiconductors
\yr 2020
\vol 54
\issue 7
\pages 765--773
\crossref{https://doi.org/10.1134/S1063782620070106}
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