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Fizika i Tekhnika Poluprovodnikov, 2019, Volume 53, Issue 4, Pages 462–465
DOI: https://doi.org/10.21883/FTP.2019.04.47439.9021
(Mi phts5533)
 

Surface, interfaces, thin films

Effect of a second-order phase transition on the electrical conductivity of metal/semiconductor structures

I. R. Nabiullina, R. M. Gadieva, A. N. Lachinovb

a Bashkir State Pedagogical University n. a. M. Akmulla, Ufa
b Institute of Molecule and Crystal Physics, Ufa Federal Research Centre, Russian Academy of Sciences
Abstract: The properties of the Cr–$p$-Si potential barrier near the temperature of the antiferromagnetic–paramagnetic phase transition in chromium are investigated. A significant change in the potential barrier and an anomalous increase in the conductivity in the Cr–$p$-Si–Au structure are observed near the temperature of the second-order antiferromagnetic–paramagnetic phase transition in chromium. It is established that current fluctuations in the structure are enhanced when approaching the phase-transition point. The experimental results are interpreted based on the assumption that the observed change in the electron-transport properties of the Cr–Si interface is due to a shift of the Fermi quasi-level in chromium as a result of the second-order phase transition.
Received: 15.11.2018
Revised: 26.11.2018
Accepted: 26.11.2018
English version:
Semiconductors, 2019, Volume 53, Issue 4, Pages 439–441
DOI: https://doi.org/10.1134/S1063782619040201
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: I. R. Nabiullin, R. M. Gadiev, A. N. Lachinov, “Effect of a second-order phase transition on the electrical conductivity of metal/semiconductor structures”, Fizika i Tekhnika Poluprovodnikov, 53:4 (2019), 462–465; Semiconductors, 53:4 (2019), 439–441
Citation in format AMSBIB
\Bibitem{NabGadLac19}
\by I.~R.~Nabiullin, R.~M.~Gadiev, A.~N.~Lachinov
\paper Effect of a second-order phase transition on the electrical conductivity of metal/semiconductor structures
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2019
\vol 53
\issue 4
\pages 462--465
\mathnet{http://mi.mathnet.ru/phts5533}
\crossref{https://doi.org/10.21883/FTP.2019.04.47439.9021}
\elib{https://elibrary.ru/item.asp?id=37644613}
\transl
\jour Semiconductors
\yr 2019
\vol 53
\issue 4
\pages 439--441
\crossref{https://doi.org/10.1134/S1063782619040201}
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