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Surface, interfaces, thin films
Effect of a second-order phase transition on the electrical conductivity of metal/semiconductor structures
I. R. Nabiullina, R. M. Gadieva, A. N. Lachinovb a Bashkir State Pedagogical University n. a. M. Akmulla, Ufa
b Institute of Molecule and Crystal Physics, Ufa Federal Research Centre, Russian Academy of Sciences
Abstract:
The properties of the Cr–$p$-Si potential barrier near the temperature of the antiferromagnetic–paramagnetic phase transition in chromium are investigated. A significant change in the potential barrier and an anomalous increase in the conductivity in the Cr–$p$-Si–Au structure are observed near the temperature of the second-order antiferromagnetic–paramagnetic phase transition in chromium. It is established that current fluctuations in the structure are enhanced when approaching the phase-transition point. The experimental results are interpreted based on the assumption that the observed change in the electron-transport properties of the Cr–Si interface is due to a shift of the Fermi quasi-level in chromium as a result of the second-order phase transition.
Received: 15.11.2018 Revised: 26.11.2018 Accepted: 26.11.2018
Citation:
I. R. Nabiullin, R. M. Gadiev, A. N. Lachinov, “Effect of a second-order phase transition on the electrical conductivity of metal/semiconductor structures”, Fizika i Tekhnika Poluprovodnikov, 53:4 (2019), 462–465; Semiconductors, 53:4 (2019), 439–441
Linking options:
https://www.mathnet.ru/eng/phts5533 https://www.mathnet.ru/eng/phts/v53/i4/p462
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