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This article is cited in 9 scientific papers (total in 9 papers)
Semiconductor physics
Study of the voltage drop process for the case of high-power thyristors switched in the impact-ionization mode
A. I. Gusevab, S. K. Lyubutina, S. N. Rukina, S. N. Tsyranovab a Institute of Electrophysics, Ural Branch, Russian Academy of Sciences, Ekaterinburg
b Ural Federal University, Ekaterinburg
Abstract:
The voltage drop process for the case of high-power thyristors switched to the conducting state by an impact-ionization wave excited by means of an overvoltage pulse with a nanosecond rise time is studied. In experiments, a voltage with a rise rate $dU/dt$ in the range of 0.5 to 6 kV/ns is applied to a thyristor with an operating voltage of 2 kV. Numerical simulation shows that the calculated and experimentally observed voltage drop times are in quantitative agreement only when the structure active area through which the switching current flows depends on $dU/dt$. The active area increases with dU/dt and with increasing initial silicon resistivity. In this case, the active area steadily approaches the total structure area at $dU/dt>$ 12 kV/ns.
Received: 06.10.2016 Accepted: 26.10.2016
Citation:
A. I. Gusev, S. K. Lyubutin, S. N. Rukin, S. N. Tsyranov, “Study of the voltage drop process for the case of high-power thyristors switched in the impact-ionization mode”, Fizika i Tekhnika Poluprovodnikov, 51:5 (2017), 680–688; Semiconductors, 51:5 (2017), 649–656
Linking options:
https://www.mathnet.ru/eng/phts6167 https://www.mathnet.ru/eng/phts/v51/i5/p680
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