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Fizika i Tekhnika Poluprovodnikov, 2016, Volume 50, Issue 12, Pages 1706–1712
(Mi phts6298)
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This article is cited in 3 scientific papers (total in 3 papers)
XX International Symposium ''Nanophysics and Nanoelectronics'', Nizhny Novgorod, March 14-18, 2016
Effect of random inhomogeneities in the spatial distribution of radiation-induced defect clusters on carrier transport through the thin base of a heterojunction bipolar transistor upon neutron irradiation
A. S. Puzanova, S. V. Obolenskya, V. A. Kozlovab a Lobachevsky State University of Nizhny Novgorod
b Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod
Abstract:
We analyze the electron transport through the thin base of a GaAs heterojunction bipolar transistor with regard to fluctuations in the spatial distribution of defect clusters induced by irradiation with a fissionspectrum fast neutron flux. We theoretically demonstrate that the homogeneous filling of the working region with radiation-induced defect clusters causes minimum degradation of the dc gain of the heterojunction bipolar transistor.
Received: 27.04.2016 Accepted: 10.05.2016
Citation:
A. S. Puzanov, S. V. Obolensky, V. A. Kozlov, “Effect of random inhomogeneities in the spatial distribution of radiation-induced defect clusters on carrier transport through the thin base of a heterojunction bipolar transistor upon neutron irradiation”, Fizika i Tekhnika Poluprovodnikov, 50:12 (2016), 1706–1712; Semiconductors, 50:12 (2016), 1678–1683
Linking options:
https://www.mathnet.ru/eng/phts6298 https://www.mathnet.ru/eng/phts/v50/i12/p1706
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