|
Fizika i Tekhnika Poluprovodnikov, 2023, Volume 57, Issue 8, Pages 613–616 DOI: https://doi.org/10.61011/FTP.2023.08.56953.4966C
(Mi phts6930)
|
|
|
|
International Physics Conference, St. Petersburg, October 23-27, 2023, St. Petersburg
Influence of etching modes on the morphology and composition of the surface of multilayer porous silicon
A. S. Len'shina, Ya. A. Peshkova, O. V. Chernousovab, K. A. Barkova, S. V. Kannykina a Voronezh State University, 394018 Voronezh, Russia
b Voronezh State University of Engineering Technologies, 394000 Voronezh, Russia
DOI:
https://doi.org/10.61011/FTP.2023.08.56953.4966C
Abstract:
Based on X-ray reflectometry and ultrasoft X-ray spectroscopy data, the opportunity of controlling surface porosity using multi-stage electrochemical etching modes is presented. It is presented how, with an increase in the porosity index of the near-surface layer, the morphology changes and the degree of oxidation of multilayer porous silicon samples increases.
Keywords:
porous silicon, X-ray reflectometry, porosity.
Received: 03.05.2023 Revised: 07.07.2023 Accepted: 30.10.2023
Citation:
A. S. Len'shin, Ya. A. Peshkov, O. V. Chernousova, K. A. Barkov, S. V. Kannykin, “Influence of etching modes on the morphology and composition of the surface of multilayer porous silicon”, Fizika i Tekhnika Poluprovodnikov, 57:8 (2023), 613–616
Linking options:
https://www.mathnet.ru/eng/phts6930 https://www.mathnet.ru/eng/phts/v57/i8/p613
|
| Statistics & downloads: |
| Abstract page: | 57 | | Full-text PDF : | 24 |
|