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Fizika i Tekhnika Poluprovodnikov, 2022, Volume 56, Issue 9, Pages 882–887
DOI: https://doi.org/10.21883/FTP.2022.09.53409.9928
(Mi phts7119)
 

This article is cited in 3 scientific papers (total in 3 papers)

Spectroscopy, interaction with radiation

Radiation damage accumulation in $\alpha$-Ga$_2$O$_3$ under P and PF$_4$ ion bombardment

P. A. Karaseova, K. V. Karabeshkina, A. I. Struchkova, A. I. Pechnikovbc, V. I. Nikolaevbc, V. D. Andreeva, A. I. Titov

a Peter the Great St. Petersburg Polytechnic University, 195251 St. Petersburg, Russia
b Ioffe Institute, 194021 St. Petersburg, Russia
c Perfect Crystals LLC, 194021 St. Petersburg, Russia
Full-text PDF (224 kB) Citations (3)
Abstract: We study radiation damage accumulation in alpha polymorph of gallium oxide ($\alpha$-Ga$_2$O$_3$) epitaxial layers under irradiation with 40 keV monatomic P and 140 keV molecular PF$_4$ ions. The distribution of stable structural damage is bimodal in both cases. The growth rate of the surface disordered layer under PF$_4$ ion irradiation is significantly higher than that under monatomic P ion bombardment. At the same time, monatomic ion irradiation is more efficient in the bulk defect peak formation. Thus, the density of displacement cascades strongly affects the formation of stable damage in $\alpha$-gallium oxide. The doses required to create the same level of disorder in the metastable $\alpha$-polymorph are higher than that in the thermodynamically stable $\alpha$-. Mechanisms of damage formation in these polymorphs are different.
Keywords: gallium oxide, $\alpha$-Ga$_2$O$_3$, ion bombardment, collision cascades, radiation damage, collision cascade density, defect engineering, radiation resistance.
Funding agency Grant number
Russian Science Foundation 22-19-00196
This study was supported by the Russian Science Foundation, grant No. 22-19-00196.
Received: 03.07.2022
Revised: 31.07.2022
Accepted: 04.08.2022
English version:
Semiconductors, 2023, Volume 57, Issue 10, Pages 459–464
DOI: https://doi.org/10.1134/S1063782623070102
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: P. A. Karaseov, K. V. Karabeshkin, A. I. Struchkov, A. I. Pechnikov, V. I. Nikolaev, V. D. Andreeva, A. I. Titov, “Radiation damage accumulation in $\alpha$-Ga$_2$O$_3$ under P and PF$_4$ ion bombardment”, Fizika i Tekhnika Poluprovodnikov, 56:9 (2022), 882–887; Semiconductors, 57:10 (2023), 459–464
Citation in format AMSBIB
\Bibitem{KarKarStr22}
\by P.~A.~Karaseov, K.~V.~Karabeshkin, A.~I.~Struchkov, A.~I.~Pechnikov, V.~I.~Nikolaev, V.~D.~Andreeva, A.~I.~Titov
\paper Radiation damage accumulation in $\alpha$-Ga$_2$O$_3$ under P and PF$_4$ ion bombardment
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2022
\vol 56
\issue 9
\pages 882--887
\mathnet{http://mi.mathnet.ru/phts7119}
\crossref{https://doi.org/10.21883/FTP.2022.09.53409.9928}
\elib{https://elibrary.ru/item.asp?id=49607468}
\transl
\jour Semiconductors
\yr 2023
\vol 57
\issue 10
\pages 459--464
\crossref{https://doi.org/10.1134/S1063782623070102}
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  • https://www.mathnet.ru/eng/phts/v56/i9/p882
  • This publication is cited in the following 3 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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