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Fizika i Tekhnika Poluprovodnikov, 2015, Volume 49, Issue 1, Pages 76–81 (Mi phts7187)  

XVIII Symposium "Nanophysics and Nanoelectronics", Nizhni Novgorod, March 10-14, 2014

Extension of the radiative lifetime of Wannier–Mott excitons in semiconductor nanoclusters

V. A. Kukushkinab

a Institute of Applied Physics, Russian Academy of Sciences, Nizhny Novgorod
b Lobachevsky State University of Nizhny Novgorod
Abstract: The purpose of the study is to calculate the radiative lifetime of Wannier–Mott excitons in three-dimensional potential wells formed of direct-gap narrow-gap semiconductor nanoclusters in wide-gap semiconductors and assumed to be large compared to the exciton radius. Calculations are carried out for the InAs/GaAs heterosystem. It is shown that, as the nanocluster dimensions are reduced to values on the order of the exciton radius, the exciton radiative lifetime becomes several times longer compared to that in a homogeneous semiconductor. The increase in the radiative lifetime is more pronounced at low temperatures. Thus, it is established that the placement of Wannier–Mott excitons into direct-gap semiconductor nanoclusters, whose dimensions are of the order of the exciton radius, can be used for considerable extension of the exciton radiative lifetime.
Received: 23.05.2014
Accepted: 15.06.2014
English version:
Semiconductors, 2015, Volume 49, Issue 1, Pages 75–80
DOI: https://doi.org/10.1134/S1063782615010157
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. A. Kukushkin, “Extension of the radiative lifetime of Wannier–Mott excitons in semiconductor nanoclusters”, Fizika i Tekhnika Poluprovodnikov, 49:1 (2015), 76–81; Semiconductors, 49:1 (2015), 75–80
Citation in format AMSBIB
\Bibitem{Kuk15}
\by V.~A.~Kukushkin
\paper Extension of the radiative lifetime of Wannier--Mott excitons in semiconductor nanoclusters
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2015
\vol 49
\issue 1
\pages 76--81
\mathnet{http://mi.mathnet.ru/phts7187}
\elib{https://elibrary.ru/item.asp?id=24195069}
\transl
\jour Semiconductors
\yr 2015
\vol 49
\issue 1
\pages 75--80
\crossref{https://doi.org/10.1134/S1063782615010157}
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