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Fizika i Tekhnika Poluprovodnikov, 2015, Volume 49, Issue 3, Pages 307–313
(Mi phts7228)
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This article is cited in 3 scientific papers (total in 3 papers)
Spectroscopy, interaction with radiation
Positronics of radiation-induced effects in chalcogenide glassy semiconductors
O. Shpotyukab, S. A. Kozyukhincd, M. Shpotyukae, A. Ingramf, R. Szatanikg a Karat Scientific and Production Enterprise, L'vov
b Jan Dlugosz University, Czestochowa, 42200, Poland
c Kurnakov Institute of General and Inorganic Chemistry, Russian Academy of Sciences, Moscow
d Tomsk State University
e Lviv Polytechnic National University
f Opole University of Technology, Opole, 45370, Poland
g Opole University, Opole, 45040, Poland
Abstract:
Using As$_2$S$_3$ and AsS$_2$ glasses as an example, the principal possibility of using positron annihilation spectroscopy methods for studying the evolution of the free volume of hollow nanoobjects in chalcogenide glassy semiconductors exposed to radiation is shown. The results obtained by measurements of the positron annihilation lifetime and Doppler broadening of the annihilation line in reverse chronological order are in full agreement with the optical spectroscopy data in the region of the fundamental absorption edge, being adequately described within coordination defect-formation and physical-aging models.
Received: 15.04.2014 Accepted: 22.04.2014
Citation:
O. Shpotyuk, S. A. Kozyukhin, M. Shpotyuk, A. Ingram, R. Szatanik, “Positronics of radiation-induced effects in chalcogenide glassy semiconductors”, Fizika i Tekhnika Poluprovodnikov, 49:3 (2015), 307–313; Semiconductors, 49:3 (2015), 298–304
Linking options:
https://www.mathnet.ru/eng/phts7228 https://www.mathnet.ru/eng/phts/v49/i3/p307
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