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Fizika i Tekhnika Poluprovodnikov, 2015, Volume 49, Issue 4, Pages 569–572
(Mi phts7274)
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This article is cited in 22 scientific papers (total in 22 papers)
Manufacturing, processing, testing of materials and structures
MBE growth of GaP on a Si substrate
M. S. Sobolev, A. Lazarenko, E. V. Nikitina, E. V. Pirogov, A. S. Gudovskikh, A. Yu. Egorov St. Petersburg Academic University — Nanotechnology Research and Education Centre of the Russian Academy of Sciences (the Academic University)
Abstract:
It is shown that single-crystal GaP buffer layers can be formed on a Si substrate by molecular-beam epitaxy, with the “migration-enhanced epitaxy” procedure applied in the stage in which the nucleating layer is formed. When a GaP layer is produced on a $p$-type silicon substrate, a $p$–$n$ junction is created in a natural way between the $p$-Si substrate and the surface $n$-Si layer produced by the diffusion of phosphorus into the substrate during the course of the epitaxial growth of GaP. This $p$–$n$ junction can be used as the first junction of a silicon-based multijunction photovoltaic converter.
Received: 22.09.2014 Accepted: 30.09.2014
Citation:
M. S. Sobolev, A. Lazarenko, E. V. Nikitina, E. V. Pirogov, A. S. Gudovskikh, A. Yu. Egorov, “MBE growth of GaP on a Si substrate”, Fizika i Tekhnika Poluprovodnikov, 49:4 (2015), 569–572; Semiconductors, 49:4 (2015), 559–562
Linking options:
https://www.mathnet.ru/eng/phts7274 https://www.mathnet.ru/eng/phts/v49/i4/p569
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