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Fizika i Tekhnika Poluprovodnikov, 2015, Volume 49, Issue 7, Pages 920–924 (Mi phts7334)  

This article is cited in 12 scientific papers (total in 12 papers)

Spectroscopy, interaction with radiation

Properties of antimony doped ZnO thin films deposited by spray pyrolysis technique

N. Sadananda Kumar, Kasturi V. Bangera, G. K. Shivakumar

Thin Films Laboratory, Department of Physics, National Institute of Technology Karnataka, Surathkal, 575025 Mangalore, India
Abstract: Antimony (Sb) doped zinc oxide (ZnO) thin films were deposited on the glass substrate at 450$^\circ$C using spray pyrolysis technique. Effect of Sb doping on surface morphology structural, optical and electrical properties were studied. X-ray diffraction (XRD) analysis showed that both the undoped and doped ZnO thin films are polycrystalline in nature with (101) preferred orientation. SEM analysis showed a change in surface morphology of Sb doped ZnO thin films. Doping results in a marked increase in conductivity without affecting the transmittance of the films. ZnO films prepared with 3 at% Sb shows the lowest resistivity of 0.185 $\Omega$ $\cdot$ cm with a Hall mobility of 54.05 cm$^2$V$^{-1}$s$^{-1}$, and a hole concentration of 6.25 $\times$ 10$^{17}$ cm$^{-3}$.
Received: 18.09.2013
Accepted: 02.12.2014
English version:
Semiconductors, 2015, Volume 49, Issue 7, Pages 899–904
DOI: https://doi.org/10.1134/S1063782615070143
Bibliographic databases:
Document Type: Article
Language: English
Citation: N. Sadananda Kumar, Kasturi V. Bangera, G. K. Shivakumar, “Properties of antimony doped ZnO thin films deposited by spray pyrolysis technique”, Fizika i Tekhnika Poluprovodnikov, 49:7 (2015), 920–924; Semiconductors, 49:7 (2015), 899–904
Citation in format AMSBIB
\Bibitem{SadBanShi15}
\by N.~Sadananda Kumar, Kasturi~V.~Bangera, G.~K.~Shivakumar
\paper Properties of antimony doped ZnO thin films deposited by spray pyrolysis technique
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2015
\vol 49
\issue 7
\pages 920--924
\mathnet{http://mi.mathnet.ru/phts7334}
\elib{https://elibrary.ru/item.asp?id=24195218}
\transl
\jour Semiconductors
\yr 2015
\vol 49
\issue 7
\pages 899--904
\crossref{https://doi.org/10.1134/S1063782615070143}
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  • https://www.mathnet.ru/eng/phts/v49/i7/p920
  • This publication is cited in the following 12 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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