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Fizika i Tekhnika Poluprovodnikov, 2015, Volume 49, Issue 9, Pages 1238–1242
(Mi phts7390)
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This article is cited in 1 scientific paper (total in 1 paper)
Semiconductor structures, low-dimensional systems, quantum phenomena
Characterization of the spatial inhomogeneity of heterointerfaces in GaAs/AlGaAs quantum wells by photoreflectance spectroscopy
L. P. Avakyantsa, P. Yu. Bokova, G. B. Galievb, I. P. Kazakovc, A. V. Chervyakova a Lomonosov Moscow State University, Faculty of Physics
b V. G. Mokerov Institute of Ultra High Frequency Semiconductor Electronics of RAS, Moscow
c P. N. Lebedev Physical Institute, Russian Academy of Sciences, Moscow
Abstract:
GaAs/AlGaAs quantum-well heterostructures with well widths from 20 to 35 nm are investigated by photoreflectance spectroscopy. The broadening of spectral lines related to band-to-band transitions increases with the transition energy and decreases with the well width. The observed decrease in the broadening parameter with increasing well width is explained in terms of spatial inhomogeneity of the heterointerfaces. According to the experimental data, the interface inhomogeneity in the structures under study is 0.34–0.39 nm (1.3–1.4 monolayers).
Received: 17.02.2015 Accepted: 25.02.2015
Citation:
L. P. Avakyants, P. Yu. Bokov, G. B. Galiev, I. P. Kazakov, A. V. Chervyakov, “Characterization of the spatial inhomogeneity of heterointerfaces in GaAs/AlGaAs quantum wells by photoreflectance spectroscopy”, Fizika i Tekhnika Poluprovodnikov, 49:9 (2015), 1238–1242; Semiconductors, 49:9 (2015), 1202–1206
Linking options:
https://www.mathnet.ru/eng/phts7390 https://www.mathnet.ru/eng/phts/v49/i9/p1238
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