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Fizika i Tekhnika Poluprovodnikov, 2015, Volume 49, Issue 12, Pages 1689–1693
(Mi phts7468)
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This article is cited in 1 scientific paper (total in 1 paper)
Electronic properties of semiconductors
Electron conductivity in GeTe and GeSe upon ion implantation of Bi
Ya. G. Fedorenko Advanced Technology Institute, Department of Electronic Engineering, University of Surrey, Guildford, GU2 7XH, United Kingdom
Abstract:
This paper presents results on ion implantation of bismuth in GeTe and GeSe films. The conductivity and the thermopower of amorphous chalcogenide films are investigated. Electron conductivity in the films is attained at the Bi implantation doses higher than (1.5–2) $\times$ 10$^{16}$ cm$^{-2}$. In conjunction with the structural modification in the films as revealed Raman spectroscopy, the results suggest the structural re-arrangement of the amorphous network occurs via weakening the bonds of a lower energy. The onset of electron conductivity is hindered by a stronger bond in an alloy. In GeTe, this is the Ge–Ge bond.
Received: 19.07.2014 Accepted: 13.05.2015
Citation:
Ya. G. Fedorenko, “Electron conductivity in GeTe and GeSe upon ion implantation of Bi”, Fizika i Tekhnika Poluprovodnikov, 49:12 (2015), 1689–1693; Semiconductors, 49:12 (2015), 1640–1644
Linking options:
https://www.mathnet.ru/eng/phts7468 https://www.mathnet.ru/eng/phts/v49/i12/p1689
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