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Fizika i Tekhnika Poluprovodnikov, 2014, Volume 48, Issue 5, Pages 648–653
(Mi phts7590)
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This article is cited in 11 scientific papers (total in 11 papers)
Semiconductor structures, low-dimensional systems, quantum phenomena
Size effect in galvanomagnetic phenomena in bismuth films doped with tellurium
V. M. Grabova, E. V. Demidova, V. A. Komarova, D. Yu. Matveeva, A. A. Nikolaevab, D. S. Markusheva, E. V. Konstantinova, E. E. Konstantinovaa a Herzen State Pedagogical University of Russia, St. Petersburg
b Gitsu Institute of Electronic Engineering and Nanotechnologies
Abstract:
The results of experimental investigation of galvanomagnetic phenomena in single-crystalline and block films of tellurium-doped bismuth in the temperature range of 77–300 K and in the film-thickness range of 0.1–1 $\mu$m are presented. It is shown that the charge-carrier concentration in the investigated films is independent of thickness, the charge carriers are scattered at phonons, the film surface, structural defects, and crystallite boundaries. The values and ratio of the listed contributions to the restriction of charge-carrier mobility depend on the tellurium content, film thickness, and also their single-crystalline or block state.
Received: 05.09.2013 Accepted: 12.09.2013
Citation:
V. M. Grabov, E. V. Demidov, V. A. Komarov, D. Yu. Matveev, A. A. Nikolaeva, D. S. Markushev, E. V. Konstantinov, E. E. Konstantinova, “Size effect in galvanomagnetic phenomena in bismuth films doped with tellurium”, Fizika i Tekhnika Poluprovodnikov, 48:5 (2014), 648–653; Semiconductors, 48:5 (2014), 630–635
Linking options:
https://www.mathnet.ru/eng/phts7590 https://www.mathnet.ru/eng/phts/v48/i5/p648
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