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Fizika i Tekhnika Poluprovodnikov, 2014, Volume 48, Issue 11, Pages 1484–1486
(Mi phts7742)
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This article is cited in 4 scientific papers (total in 4 papers)
Surface, interfaces, thin films
Electron diffraction study of the phase formation of Tl–Fe–Se and kinetics of phase transformations of films TlFeSe$_2$
E. B. Askerovab, A. I. Madadzadaac, D. I. Ismailovc, R. N. Mehtievaa a Joint Institute for Nuclear Research, Dubna, Moscow region
b Institute of radiation problems, ANAS
c Institute of Physics Azerbaijan Academy of Sciences
Abstract:
The conditions of phase formation in the Tl–Fe–Se system and the crystallization kinetics of amorphous TlFeSe$_2$ films are investigated by electron-diffraction structural analysis and kinematic electronography. It is shown that the crystallization of amorphous TlFeSe$_2$ films is described by the analytical expression of kinetic phase-transformation curves $V_t=V_0[1-\exp(kt^m)]$. The growth dimensionality during the crystallization of amorphous TlFeSe$_2$ equal to three and the activation energies of nucleation and crystal growth are determined.
Received: 18.03.2014 Accepted: 28.03.2014
Citation:
E. B. Askerov, A. I. Madadzada, D. I. Ismailov, R. N. Mehtieva, “Electron diffraction study of the phase formation of Tl–Fe–Se and kinetics of phase transformations of films TlFeSe$_2$”, Fizika i Tekhnika Poluprovodnikov, 48:11 (2014), 1484–1486; Semiconductors, 48:11 (2014), 1449–1451
Linking options:
https://www.mathnet.ru/eng/phts7742 https://www.mathnet.ru/eng/phts/v48/i11/p1484
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