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Fizika i Tekhnika Poluprovodnikov, 2013, Volume 47, Issue 6, Pages 772–776 (Mi phts7924)  
This article is cited in 2 scientific papers (total in 2 papers)

Surface, interfaces, thin films

Study of the I–V characteristics of nanostructured Pd films on a Si substrate after vacuum annealing

S. V. Tomilin, A. S. Yanovskii, O. A. Tomilina, G. R. Mikaelyan

Zaporizhzhya National University
Full-text PDF (661 kB) Citations (2)
Abstract: The I–V characteristics of nanostructured Pd films on a Si substrate are investigated. The nanostructures (nanoislands) are formed by the vacuum annealing of continuous ultrathin Pd films sputtered onto a substrate. The shape of the I–V characteristics of the investigated Si substrate-Pd film system is shown to be heavily dependent on the degree of film nanostructuring. The surface morphology of the films is studied using scanning electron microscopy.
Received: 06.08.2012
Accepted: 28.08.2012
English version:
Semiconductors, 2013, Volume 47, Issue 6, Pages 782–786
DOI: https://doi.org/10.1134/S1063782613060286
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: S. V. Tomilin, A. S. Yanovskii, O. A. Tomilina, G. R. Mikaelyan, “Study of the I–V characteristics of nanostructured Pd films on a Si substrate after vacuum annealing”, Fizika i Tekhnika Poluprovodnikov, 47:6 (2013), 772–776; Semiconductors, 47:6 (2013), 782–786
Citation in format AMSBIB
\Bibitem{TomYanTom13}
\by S.~V.~Tomilin, A.~S.~Yanovskii, O.~A.~Tomilina, G.~R.~Mikaelyan
\paper Study of the I--V characteristics of nanostructured Pd films on a Si substrate after vacuum annealing
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2013
\vol 47
\issue 6
\pages 772--776
\mathnet{http://mi.mathnet.ru/phts7924}
\elib{https://elibrary.ru/item.asp?id=20319463}
\transl
\jour Semiconductors
\yr 2013
\vol 47
\issue 6
\pages 782--786
\crossref{https://doi.org/10.1134/S1063782613060286}
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  • https://www.mathnet.ru/eng/phts/v47/i6/p772
    • This publication is cited in the following 2 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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