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Fizika i Tekhnika Poluprovodnikov, 2013, Volume 47, Issue 7, Pages 890–898
(Mi phts7946)
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This article is cited in 3 scientific papers (total in 3 papers)
Electronic properties of semiconductors
New acceptor centers of the background impurities in $p$-CdZnTe
S. V. Plyatsko, L. V. Rashkovetskyi Institute of Semiconductor Physics NAS, Kiev
Abstract:
Low-temperature photoluminescence data are used to study the redistribution of the background impurities and host components of $p$-CdZnTe single crystals with a resistivity of 1–50 $\Omega$ cm upon their interaction with infrared laser radiation. The effect of widening of the band gap and the formation of new acceptor centers in response to laser-stimulated changes in the system of intrinsic defects are established. The activation energy of the new acceptor centers is determined.
Received: 24.05.2012 Accepted: 19.10.2012
Citation:
S. V. Plyatsko, L. V. Rashkovetskyi, “New acceptor centers of the background impurities in $p$-CdZnTe”, Fizika i Tekhnika Poluprovodnikov, 47:7 (2013), 890–898; Semiconductors, 47:7 (2013), 899–907
Linking options:
https://www.mathnet.ru/eng/phts7946 https://www.mathnet.ru/eng/phts/v47/i7/p890
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