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Fizika i Tekhnika Poluprovodnikov, 2013, Volume 47, Issue 10, Pages 1344–1346
(Mi phts8037)
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Semiconductor structures, low-dimensional systems, quantum phenomena
Effect of the annealing temperature on the low-temperature photoluminescence in Si:Er light-emitting structures grown by molecular-beam epitaxy
B. A. Andreeva, N. A. Sobolevb, D. V. Denisovb, E. I. Shekb a Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod
b Ioffe Institute, St. Petersburg
Abstract:
The photoluminescence spectra of light-emitting structures based on silicon doped with erbium during the course of molecular-beam epitaxy at a temperature of 500$^\circ$C are studied at 4.2 K on being annealed at 800–900$^\circ$C. Three sets of lines belonging to the emitting centers of erbium in silicon with a low oxygen-impurity concentration are revealed.
Received: 04.03.2013 Accepted: 18.03.2013
Citation:
B. A. Andreev, N. A. Sobolev, D. V. Denisov, E. I. Shek, “Effect of the annealing temperature on the low-temperature photoluminescence in Si:Er light-emitting structures grown by molecular-beam epitaxy”, Fizika i Tekhnika Poluprovodnikov, 47:10 (2013), 1344–1346; Semiconductors, 47:10 (2013), 1333–1335
Linking options:
https://www.mathnet.ru/eng/phts8037 https://www.mathnet.ru/eng/phts/v47/i10/p1344
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