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Fizika i Tekhnika Poluprovodnikov, 2012, Volume 46, Issue 2, Pages 247–251 (Mi phts8157)  

Semiconductor physics

Study of the emission extraction efficiency of mesa-LEDs with a narrow-gap InAsSb active region

E. A. Grebenshchikova, A. N. Imenkov, S. S. Kizhaev, A. S. Golovin, Yu. P. Yakovlev

Ioffe Institute, St. Petersburg
Abstract: A series of light-emitting diodes (LEDs) (emission peak wavelength $\lambda_{\mathrm{max}}$ = 3.6 $\mu$m) with cone-shaped mesas, which have concave lateral surfaces and heights between 10 to 130 $\mu$m, has been developed. The dependence of the emission efficiency for these LEDs on mesa height has been studied at different injection currents at the temperatures 77 and 298 K. The form of the dependence observed is in agreement with the results of theoretical calculations. It is shown that the effective absorption coefficient, caused by emission extraction from the crystal, may be as large as 3 cm$^{-1}$ for LEDs with the highest mesa (130 $\mu$m) among the diodes in this series. The emission extraction coefficient is close to 30% at the temperature 298 K and 94% at 77 K.
Received: 25.07.2011
Accepted: 01.08.2011
English version:
Semiconductors, 2012, Volume 46, Issue 2, Pages 236–240
DOI: https://doi.org/10.1134/S1063782612020121
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: E. A. Grebenshchikova, A. N. Imenkov, S. S. Kizhaev, A. S. Golovin, Yu. P. Yakovlev, “Study of the emission extraction efficiency of mesa-LEDs with a narrow-gap InAsSb active region”, Fizika i Tekhnika Poluprovodnikov, 46:2 (2012), 247–251; Semiconductors, 46:2 (2012), 236–240
Citation in format AMSBIB
\Bibitem{GreImeKiz12}
\by E.~A.~Grebenshchikova, A.~N.~Imenkov, S.~S.~Kizhaev, A.~S.~Golovin, Yu.~P.~Yakovlev
\paper Study of the emission extraction efficiency of mesa-LEDs with a narrow-gap InAsSb active region
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2012
\vol 46
\issue 2
\pages 247--251
\mathnet{http://mi.mathnet.ru/phts8157}
\elib{https://elibrary.ru/item.asp?id=20319088}
\transl
\jour Semiconductors
\yr 2012
\vol 46
\issue 2
\pages 236--240
\crossref{https://doi.org/10.1134/S1063782612020121}
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