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Fizika i Tekhnika Poluprovodnikov, 2012, Volume 46, Issue 2, Pages 258–261
(Mi phts8159)
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This article is cited in 2 scientific papers (total in 2 papers)
Semiconductor physics
Nonuniformity in the spatial distribution of negative luminescence in InAsSb(P) photodiodes (long-wavelength cutoff $\lambda_{0.1}$ = 5.2 $\mu$m)
S. A. Karandashova, B. A. Matveeva, I. V. Mzhelskiib, V. G. Polovinkinb, M. A. Remennyia, A. Yu. Rybalchenkoa, N. M. Stusa a Ioffe Institute, St. Petersburg
b Rzhanov Institute of Semiconductor Physics, Siberian Branch of Russian Academy of Sciences, Novosibirsk
Abstract:
The spatial nonuniformity of negative luminescence and current crowding in InAsSb(P) mid-IR photodiodes is analyzed in relation to the applied voltage and contact size values. It is shown that this non-uniformity is one of the main causes of the poor sensitivity of photodiodes which have low dynamic resistance at zero bias and which operate in the photocurrent mode.
Received: 25.07.2011 Accepted: 01.08.2011
Citation:
S. A. Karandashov, B. A. Matveev, I. V. Mzhelskii, V. G. Polovinkin, M. A. Remennyi, A. Yu. Rybalchenko, N. M. Stus, “Nonuniformity in the spatial distribution of negative luminescence in InAsSb(P) photodiodes (long-wavelength cutoff $\lambda_{0.1}$ = 5.2 $\mu$m)”, Fizika i Tekhnika Poluprovodnikov, 46:2 (2012), 258–261; Semiconductors, 46:2 (2012), 247–250
Linking options:
https://www.mathnet.ru/eng/phts8159 https://www.mathnet.ru/eng/phts/v46/i2/p258
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