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Fizika i Tekhnika Poluprovodnikov, 2012, Volume 46, Issue 3, Pages 317–320
(Mi phts8170)
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This article is cited in 3 scientific papers (total in 3 papers)
Electronic properties of semiconductors
Electroreflectance study of the effect of $\gamma$ radiation on the optical properties of epitaxial GaN films
A. E. Belyaeva, N. I. Klyuia, R. V. Konakovaa, A. N. Lukyanova, B. A. Danil'chenkob, Yu. N. Sveshnikovc, A. N. Klyuid a Institute of Semiconductor Physics NAS, Kiev
b Institute of Physics, National Academy of Sciences of Ukraine, Kiev
c JSC Elma-Malachit, Moscow, Zelenograd
d National Taras Shevchenko University of Kyiv
Abstract:
Experimental data on the electroreflectance spectra of $\gamma$-irradiated epitaxial GaN films on sapphire are reported. The irradiation doses are 10$^5$–2 $\times$ 10$^6$ rad. The theoretical electroreflectance spectra calculated on the basis of a model of three types of transitions are in agreement with experimental data with reasonable accuracy. The energies and broadenings of the transitions derived in the context of the model give grounds to infer that, in the GaN films, there are internal stresses dependent on the $\gamma$-irradiation dose.
Received: 27.07.2011 Accepted: 16.08.2011
Citation:
A. E. Belyaev, N. I. Klyui, R. V. Konakova, A. N. Lukyanov, B. A. Danil'chenko, Yu. N. Sveshnikov, A. N. Klyui, “Electroreflectance study of the effect of $\gamma$ radiation on the optical properties of epitaxial GaN films”, Fizika i Tekhnika Poluprovodnikov, 46:3 (2012), 317–320; Semiconductors, 46:3 (2012), 302–305
Linking options:
https://www.mathnet.ru/eng/phts8170 https://www.mathnet.ru/eng/phts/v46/i3/p317
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