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Publications in Math-Net.Ru |
Citations |
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2017 |
| 1. |
E. A. Baranov, A. O. Zamchiy, A. I. Safonov, S. V. Starinskiy, S. Ya. Khmel', “Effect of a thin $a$-SiO$_{x}$:H film on plasmonic properties of gold nanoparticles”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 43:5 (2017), 24–30   ; Tech. Phys. Lett., 43:3 (2017), 244–246 |
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2015 |
| 2. |
E. A. Baranov, A. O. Zamchiy, S. Ya. Khmel', “Synthesis of $a$-SiO$_x$:H thin films by the gas-jet electron beam plasma chemical vapor deposition method”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 41:20 (2015), 89–95 ; Tech. Phys. Lett., 41:10 (2015), 1013–1015 |
8
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2013 |
| 3. |
E. A. Baranov, A. O. Zamchiy, S. Ya. Khmel', “Synthesis of aligned arrays of “Microropes” of silica nanowires by gas-jet electron beam plasma chemical vapor deposition method”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 39:22 (2013), 88–94 ; Tech. Phys. Lett., 39:11 (2013), 1023–1025 |
7
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2007 |
| 4. |
V. O. Konstantinov, S. Ya. Khmel', “Gas flow activated in an electron-beam plasma”, Prikl. Mekh. Tekh. Fiz., 48:1 (2007), 3–10 ; J. Appl. Mech. Tech. Phys., 48:1 (2007), 1–6 |
3
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2003 |
| 5. |
E. A. Baranov, S. Ya. Khmel', “Simulation of the emission spectrum of $\mathrm{SiH}$ $(\mathrm{A}^2\Delta\to\mathrm{X}^2\Pi)$ and measurement of the rotational temperature of the $\mathrm{A}^2\Delta$ state in an electron-beam plasma”, Prikl. Mekh. Tekh. Fiz., 44:5 (2003), 4–11 ; J. Appl. Mech. Tech. Phys., 44:5 (2003), 605–611 |
4
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2001 |
| 6. |
R. G. Sharafutdinov, S. Ya. Khmel', A. E. Zarvin, N. G. Korobeishchikov, V. Zh. Madirbaev, “Condensation of an argon–monosilane mixture in a free jet”, Prikl. Mekh. Tekh. Fiz., 42:3 (2001), 51–55 ; J. Appl. Mech. Tech. Phys., 42:3 (2001), 427–430 |
1
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1987 |
| 7. |
A. K. Rebrov, S. Ya. Khmel', R. G. Sharafutdinov, “Copper dimers in the vapor flow in electron-beam vaporization”, Prikl. Mekh. Tekh. Fiz., 28:4 (1987), 121–125 ; J. Appl. Mech. Tech. Phys., 28:4 (1987), 582–586 |
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1986 |
| 8. |
A. E. Belikov, E. S. Voronel', Ya. Ya. Tomsons, S. Ya. Khmel', R. G. Sharafutdinov, “Photoelectronic method for measuring time-of-flight signals”, Prikl. Mekh. Tekh. Fiz., 27:2 (1986), 18–24 ; J. Appl. Mech. Tech. Phys., 27:2 (1986), 168–173 |
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