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Publications in Math-Net.Ru |
Citations |
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2016 |
| 1. |
A. S. Parshin, S. A. Kushchenkov, O. P. Pchelyakov, Yu. L. Mikhlin, “Layer-by-layer analysis of the thickness distribution of silicon dioxide in the structure SiO$_{2}$/Si(111) by inelastic electron scattering cross-section spectroscopy”, Fizika i Tekhnika Poluprovodnikov, 50:3 (2016), 344–349   ; Semiconductors, 50:3 (2016), 339–344 |
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2011 |
| 2. |
A. S. Parshin, S. A. Kushchenkov, G. A. Alexandrova, S. G. Ovchinnikov, “New opportunities for quantitative analysis as applied to reflected electron energy loss spectroscopy of Fe/Si structures”, Zhurnal Tekhnicheskoi Fiziki, 81:5 (2011), 69–74 ; Tech. Phys., 56:5 (2011), 656–661 |
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