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Publications in Math-Net.Ru |
Citations |
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2015 |
| 1. |
P. B. Boldyrevskii, A. G. Korovin, S. A. Denisov, S. P. Svetlov, V. G. Shengurov, “Analysis of thickness unevenness of the epitaxial silicon layer during deposition from sublimation sources in a vacuum”, University proceedings. Volga region. Physical and mathematical sciences, 2015, no. 4, 93–100  |
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2014 |
| 2. |
P. B. Boldyrevskii, A. G. Korovin, S. A. Denisov, S. P. Svetlov, V. G. Shengurov, “Thickness uniformity of silicon layers grown from a sublimation source by molecular-beam epitaxy”, Zhurnal Tekhnicheskoi Fiziki, 84:11 (2014), 155–158  ; Tech. Phys., 59:11 (2014), 1732–1735 |
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