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Publications in Math-Net.Ru |
Citations |
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2022 |
| 1. |
A. A. Tatarintsev, N. A. Orlikovsky, N. G. Orlikovsaya, K. E. Ozerova, Ya. E. Shahova, “Method for measuring the dielectrics charging potential under ion irradiation using shifting the bremsstrahlung edge”, Zhurnal Tekhnicheskoi Fiziki, 92:9 (2022), 1467–1470   |
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2015 |
| 2. |
S. Yu. Kupreenko, N. A. Orlikovsky, E. I. Rau, A. M. Tagachenkov, A. A. Tatarintsev, “Determination of thickness of ultrathin surface films in nanostructures from the energy spectra of reflected electrons”, Zhurnal Tekhnicheskoi Fiziki, 85:10 (2015), 101–104 ; Tech. Phys., 60:10 (2015), 1515–1518 |
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2013 |
| 3. |
A. V. Gostev, N. A. Orlikovsky, E. I. Rau, A. A. Trubitsyn, “Updating of the toroidal electron spectrometer intended for a scanning electron microscope and its new applications in diagnostics of micro- and nanoelectronic structures”, Zhurnal Tekhnicheskoi Fiziki, 83:3 (2013), 140–147 ; Tech. Phys., 58:3 (2013), 447–454 |
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2012 |
| 4. |
E. I. Rau, N. A. Orlikovsky, E. S. Ivanova, “Response function and optimum configuration of semiconductor backscattered-electron detectors for scanning electron microscopes”, Fizika i Tekhnika Poluprovodnikov, 46:6 (2012), 829–832 ; Semiconductors, 46:6 (2012), 810–813 |
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2011 |
| 5. |
N. A. Koshev, N. A. Orlikovsky, E. I. Rau, A. G. Yagola, “Solution of the inverse problem of restoring the signals from an electronic
microscope in the backscattered electron mode on the class of bounded variation
functions”, Num. Meth. Prog., 12:3 (2011), 362–367 |
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